热损伤温度对新生SD大鼠下丘脑神经元膜上ATP激活单通道活动的影响

Effect of Membrane Environment at High Temperature on Delayed Rectifier K+ Channel in Hypothalamus Ncurons

摘要: 目的观察下丘脑神经元经热损伤温度(42℃)处理后ATP激活单通道的变化.方法采用膜片钳技术的细胞贴附记录模式,记录通道的活动动力学.结果发现经高温处理后,新生SD大鼠ATP激活单通道的长时程开放时间常数(τ₀₂)、开放概率(P₀)降低(P<0.05),通道在膜上的数量和密度降低.结论热损伤可以影响ATP激活单通道的活动.

Abstract: Method The patch-clamp technique was used to record the kinetic properties of ATP activated single channel and the action of high temperature of heat injury on effects of the channel in hypothalamus neurons by cell-attached mode.Results The long-term open constant(τ₀₂)and open probability(P₀)of I_k decreased(P<0.05).While the density and distributing number decreased after heat injury.Conclusion The activating action of ATP activating single-channel might obviously be affected by heat injury temperature.